Fault-tolerance capacity of the multilevel active-clamped topology

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Title:	Fault-tolerance capacity of the multilevel active-clamped topology
Author:	Nicolás Apruzzese, Joan; Busquets Monge, Sergio; Bordonau Farrerons, José; Alepuz Menéndez, Salvador; Calle Prado, Alejandro
Other authors:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. GREP - Grup de Recerca en Electrònica de Potència
Abstract:	Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are considered and the analysis is carried out under single-device and two-simultaneous-device faults. Switching strategies to overcome the limitations caused by faults are proposed. Experimental tests with a four-level MAC prototype are presented to validate the analysis.
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència -MAC topology -Multilevel converters -Topologia MAC
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Document type:	Article - Published version Conference Object
Published by:	IEEE Press. Institute of Electrical and Electronics Engineers
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