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Title:
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New Theoretical Analysis of the LRRM Calibration Technique for Vector Network Analyzers
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Author:
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Purroy Martín, Francesc; Pradell i Cara, Lluís
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Other authors:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
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Abstract:
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In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match (LRRM) vector network-analyzer (VNA) calibration technique is presented. As a result, it is shown that the reference-impedance (to which the LRRM calibration is referred) cannot generally be defined whenever nonideal standards are used. Based on this consideration, a new algorithm to determine the on-wafer match standard is proposed that improves the LRRM calibration accuracy. Experimental verification of the new theory and algorithm using on-wafer calibrations up to 40 GHz is given. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
-Microwave measurements
-Impedance matching
-Calibration
-calibration
-impedance matching
-measurement errors
-measurement standards
-microwave reflectometry
-network analysers
-40 GHz
-calibration accuracy
-calibration algorithm
-error model
-four-standards
-line-reflect-reflect-match calibration
-on-wafer calibrations
-on-wafer match standard
-reference impedance
-reference-impedance
-reflection coefficient magnitude
-self-calibration
-systematic errors
-vector network-analyzer calibration
-Microones -- Mesurament -- Processament de dades
-Impedància (Electricitat) |
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Rights:
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Document type:
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Article |
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Published by:
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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