Extraction of noise parameters of transistor using a spectrum analyser and 50^ noise figure measurements only.

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Title:	Extraction of noise parameters of transistor using a spectrum analyser and 50^ noise figure measurements only.
Author:	Lázaro Guillén, Antoni; Pradell i Cara, Lluís
Other authors:	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
Abstract:	A method for measuring the four noise parameters of a transistor in the microwave range using a configuration based on a conventional spectrum analyser is presented. In contrast to previous methods, it requires wideband 50 Θ noise-figure measurements only. The method features an accuracy similar to that of noise figure meters at a much higher measurement speed and lower cost.
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques -Microwave transistors -electric noise measurement -microwave measurement -microwave transistors -spectral analysers -semiconductor device measurement -Microones -- Transistors
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Document type:	Article
Published by:	IEE
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