Title:
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Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges
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Author:
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Nguyen, T. D.; O'Callaghan Castellà, Juan Manuel; Davidson, B. A.; Redwing, R. D.; Hohenwarter, G. K. G.; Nordman, J. E.; Beyer, J. B.
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Other authors:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
Abstract:
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We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage. |
Abstract:
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Peer Reviewed |
Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques -High temperature superconductors -Superconductivity -1/f noise -barium compounds -flux flow -flux pinning -high-temperature superconductors -superconducting device noise -superconducting device testing -superconducting microbridges -superconducting thin films -yttrium compounds -Superconductors a altes temperatures -Superconductivitat |
Rights:
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Document type:
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Article |
Published by:
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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