For electromagnetic analysis using method of moments (MoM), three-dimensional (3-D) arbitrary conducting surfaces are often discretized in Rao, Wilton and Glisson basis functions. The MoM Galerkin discretization of the magnetic field integral equation (MFIE) includes a factor Ω0 equal to the solid angle external to the surface at the testing points, which is 2π everywhere on the surface of the object, except at the edges or tips that constitute a set of zero measure. However, the standard formulation of the MFIE with Ω0=2π leads to inaccurate results for electrically small sharp-edged objects. This paper presents a correction to the Ω0 factor that, using Galerkin testing in the MFIE, gives accuracy comparable to the electric field integral equation (EFIE), which behaves very well for small sharp-edged objects and can be taken as a reference

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