Title:
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Hot spot detection in integrated circuits laterally accessing to the substrate
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Author:
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Perpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
Abstract:
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Thermal management of nano estructures requires the use of temperature monitoring strategies. In this work we expose a strategy bases on sensing the heat-flux within the chip substrate with a probe-laser beam. As the beam passes through the die, it experiences a deflection directly proportional to the heat-flux found along its trajectory (Internal Interfrared-laser deflection technique, IIR-LD) . As application example, we expose how hot spots can be detected in Integrated Circuits. |
Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica -Integrated circuits -Metal oxide semiconductors, Complementary -Electrical engineering -Electronic -Metal oxide semiconductor field-effect transistors -Circuits integrats -Electrònica |
Rights:
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Document type:
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Article - Published version Conference Object |
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