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Title:
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Error analysis in two-terminal impedance measurements with residual correction
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Author:
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Torrents Dolz, Josep M.; Pallàs Areny, Ramon
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica; Universitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies |
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Abstract:
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Residual impedance correction in impedance analyzers when using an asymmetrical test fixture needs three reference measurements, usually open circuit, short circuit, and
load (meaning an impedance close to the impedance under test).
This paper provides an error estimate for impedance measurements that apply a simple open/short correction in spite of using
an asymmetrical test fixture. Experimental results show that the minimal error is obtained for impedance values close to the
geometric mean of the short-circuit and open-circuit impedances, and that the theoretical prediction is indeed an upper limit for the actual error. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria biomèdica::Electrònica biomèdica
-Impedance (Electricity)
-Error analysis (Mathematics)
-Electric impedance measurement
-Error analysis
-Residual impedance correction
-Impedance analyzers
-Asymmetrical test fixture
-Reference measurements
-Error estimation
-Open/short correction
-Short-circuit impedance
-Open-circuit impedances
-Impedància (Electricitat)
-Anàlisi d'error (Matemàtica) |
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Rights:
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Document type:
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Article |
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Published by:
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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