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Title:
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Propagation of measurement noise through backprojection reconstruction in electrical impedance tomography
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Author:
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Frangi Caregnato, Alejandro; Riu Costa, Pere Joan; Rosell Ferrer, Francisco Javier; Viergever, Max A.
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica |
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Abstract:
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A framework to analyze the propagation of measurement noise through backprojection reconstruction algorithms in electrical impedance tomography (EIT) is presented. Two
measurement noise sources were considered: noise in the current drivers and in the voltage detectors. The influence of the acquisition system architecture (serial/semi-parallel) is also discussed. Three variants of backprojection reconstruction are studied:
basic (unweighted), weighted and exponential backprojection.
The results of error propagation theory have been compared with those obtained from simulated and experimental data. This
comparison shows that the approach provides a good estimate of the reconstruction error variance. It is argued that the reconstruction error in EIT images obtained via backprojection can be approximately modeled as a spatially nonstationary Gaussian
distribution. This methodology allows us to develop a spatial characterization of the reconstruction error in EIT images. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria biomèdica::Electrònica biomèdica
-Electrodiagnosis
-Computer vision
-Electric impedance imaging
-Gaussian distribution
-Image reconstruction
-Measurement errors
-Medical image processing
-Backprojection reconstruction
-Medical diagnostic imaging
-Electrical impedance tomography
-Error propagation theory
-Reconstruction error characterization
-Spatial characterization
-Current drivers
-Voltage detectors
-Acquisition system architecture
-Spatially nonstationary Gaussian distribution
-Electrodiagnòstic
-Visió per ordinador en medicina |
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Rights:
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Document type:
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Article |
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Published by:
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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