Study of transient phenomena with feature selective validation method

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Título:	Study of transient phenomena with feature selective validation method
Autor/a:	Jauregui Tellería, Ricardo; Rojas, Julio; Silva Martínez, Fernando
Otros autores:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica
Abstract:	In recent years, computational electromagnetism has had a great development thanks to the computational systems speed increase and their cost reduction. With those improvements the mathematical algorithms are able to work properly with more practical EMC issues. The problem that arises many times is to become condent with the results, in other words, to be able to quantitatively validate the results of the numerical simulation. In this paper we present a method to evaluate the diference between results obtained by visual expert opinion and those obtained from the FSV method.
Abstract:	Peer Reviewed
Materia(s):	-Àrees temàtiques de la UPC::Física::Electromagnetisme -Electromagnetism --Mathematics -Electromagnetism -Electromagnetisme -- Matemàtica -Electromagnetisme
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Tipo de documento:	Artículo - Versión publicada Objeto de conferencia
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Jauregui Tellería, Ricardo; Ventosa Llopart, Oriol; Silva Martínez, Fernando; Kunze, Marco

Gil Galí, Ignacio; Fernández García, Raúl; Vives, Yolanda; Jauregui Tellería, Ricardo; Silva Martínez, Fernando

Jauregui Tellería, Ricardo; Silva Martínez, Fernando; Heras, Miguel

Jauregui Tellería, Ricardo; Silva Martínez, Fernando; Orlandi, Antonio; Sasse, Hugh; Duffy, Alistair

Jauregui Tellería, Ricardo; Riu Costa, Pere Joan; Silva Martínez, Fernando

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