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Title:
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Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations
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Author:
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Onabajo, M.; Gómez Salinas, Dídac; Aldrete Vidrio, Eduardo; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
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Abstract:
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Built-in test and on-chip calibration features are becoming essential for reliable wireless connectivity of next generation devices suffering from increasing process
variations in CMOS technologies. This paper contains an overview of contemporary self-test and performance enhancement
strategies for single-chip transceivers. In general, a trend has emerged to combine several techniques involving process variability monitoring, digital calibration,
and tuning of analog circuits. Special attention is directed towards the investigation of temperature as an observable
for process variations, given that thermal coupling through the silicon substrate has recently been demonstrated as mechanism to monitor the performances of analog circuits.
Both Monte Carlo simulations and experimental results are presented in this paper to show that circuit-level specifications exhibit correlations with silicon surface temperature changes. Since temperature changes can be measured with
efficient on-chip differential temperature sensors, a conceptual outline is given for the use of temperature sensors as
alternative process variation monitors. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
-Metal oxide semiconductors, Complementary
-CMOS process variation
-Radio transmitter -- receivers
-RF thermal testing
-RF built-in test
-CMOS |
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Rights:
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Document type:
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Article - Published version
Article |
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