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Title:
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Analog circuit test based on a digital signature
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Author:
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Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics; Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
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Abstract:
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Production verification of analog circuit specifica-
tions is a challenging task requiring expensive test equipment
and time consuming procedures. This paper presents a method
for low cost on-chip parameter verification based on the analysis
of a digital signature. A 65 nm CMOS on-chip monitor is
proposed and validated in practice. The monitor composes two
signals (x(t), y(t)) and divides the X-Y plane with nonlinear
boundaries in order to generate a digital code for every analog
(x, y) location. A digital signature is obtained using the digital
code and its time duration. A metric defining a discrepancy factor
is used to verify circuit parameters. The method is applied to
detect possible deviations in the natural frequency of a Biquad
filter. Simulated and experimental results show the possibilities
of the proposal. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
-Àrees temàtiques de la UPC::Informàtica::Seguretat informàtica::Criptografia
-Monitoring
-Digital signatures
-Linear integrated circuits
-Monitoratge
-Signatures electròniques
-Circuits integrats lineals |
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Rights:
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Document type:
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Article - Published version
Conference Object |
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