Título:
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Characterization of conducted emission at high frequency under different temperature
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Autor/a:
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Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio
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Otros autores:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group |
Abstract:
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In this paper, the characterization of the EMC conducted emissions of integrated circuits under different temperature stress condition, up to 3 GHz is presented. The impact of high temperature has been measured on the input impedance of propagation paths of the electromagnetic conducted emissions, as well as on the electromagnetic noise of a clock generator. |
Abstract:
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Peer Reviewed |
Materia(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència -Integrated circuits -Temperature -EMC -Integrated circuit -conducted emission -switching noise -temperature impact -Circuits integrats -Temperatura -- Control |
Derechos:
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Tipo de documento:
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Artículo - Versión publicada Objeto de conferencia |
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