Title:
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Criteria for indirect measurements in M-S testing
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Author:
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Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
Abstract:
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Analog and mixed-signal circuit testing is a cballenging
task demanding large amounts of resources. In order to battle
against this drawback, alternate testing has been established as an
eflicient way of testing analog and M-S circuits by using indirect
measures instead of the classic specification based testing. In
this work we propose the use of Kendall's Tau rank correlation
coeflicient for rating the suitability of a set of candidate indirect
measures to be used in mixed-signal testing. Such criterion is
shown to be adequate since it allows to avoid or minimize
information redundancy in the measures set. As a proof of
concept, a 4th order band-pass Butterworth filter has been
simulated under the presence of process variations. The circuit
has been tested using a subset of measures selected according to
minimum Kendall's Tau coeflicient. Analog test efliciency metrics
are reported showing test misclassification rate is among the best
15% possible, therefore validating the proposal. |
Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics -Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura -Linear integrated circuits -Mixed signal circuits -Mixed-Signal Test -Analog Test -Alternate Test -Indirect Measurements -Alternate Feature Selection -Signature Selection -Optimum Measures Selection -Quadtrees -Octrees -Analog Filter -Circuits integrats lineals -Circuits integrats mixtos |
Rights:
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Document type:
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Article - Published version Conference Object |
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