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Title:	Memristive crossbar design and test in non-adaptive proactive reconfiguring scheme
Author:	Pouyan, Peyman; Amat, Esteve; Rubio Sola, Jose Antonio
Other authors:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
Abstract:	One of the most promising emerging technologies is based on the use of memristive devices. Although capable of implementing certain type of logic circuits, they are being extensively used for memory applications. Beside memristor advantages such as high scalability, their drawbacks including manufacturing process variability and limited read/write endurance, could risk their future utilization. In this work we propose an implementation of a proactive reconfiguration strategy alongside a testing procedure to detect the weakest memory cells inside the crossbar. Such a realization can extend the crossbar lifetime.
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats -Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors -Integrated circuits -Computer architecture -Crossbar -RRAM -Emerging device -Memristor -Proactive reconfiguration -Process variability -Reliability -Test -Circuits integrats -Arquitectura d'ordinadors
Rights:	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
Document type:	Article - Published version Conference Object
Published by:	Institute of Electrical and Electronics Engineers (IEEE)
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