Title:
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Penelope: The NBTI-aware processor
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Author:
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Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; González Colás, Antonio María
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors; Universitat Politècnica de Catalunya. ARCO - Microarquitectura i Compiladors |
Abstract:
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Transistors consist of lower number of atoms with every technology generation. Such atoms may be displaced due to the stress caused by high temperature, frequency and current, leading to failures. NBTI (negative bias temperature instability) is one of the most important sources of failure affecting transistors. NBTI degrades PMOS transistors whenever the voltage at the gate is negative (logic input |
Abstract:
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Peer Reviewed |
Subject(s):
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-Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors -Integrated circuits -- Reliability -Reduced degradation -Penelope -NBTI-aware processor -Negative bias temperature instability -PMOS transistors -Combinational blocks -Storage blocks -Circuits integrats -- Fiabilitat |
Rights:
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Document type:
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Article - Published version Conference Object |
Published by:
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IEEE Computer Society
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