Closed-loop compensation of dielectric charge induced by ionizing radiation

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Title:	Closed-loop compensation of dielectric charge induced by ionizing radiation
Author:	Domínguez Pumar, Manuel; Gorreta Mariné, Sergio; Pons Nin, Joan; Gomez Rodriguez, Faustino; Gonzalez Castaño, Diego; Muschitiello, Michele
Other authors:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
Abstract:	This letter investigates the capability of dielectric charge control loops to cope with charge induced by ionizing radiation. To this effect, an microelectromechanical systems (MEMS) variable capacitor has been irradiated with X-rays and gamma-radiation in three scenarios: 1) without polarization; 2) using an open-loop dielectric charge mitigation strategy; and 3) using a closed-loop control method. The results show that the charge effects induced by radiation can be partially compensated using dielectric charge control.
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica -Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats -Dielectrics -Microelectromechanical systems -Dielectric charging control -MEMS reliability -Radiation effects -Ionizing radiation -MEMS -Dielèctrics -Sistemes microelectromecànics
Rights:	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
Document type:	Article - Submitted version Article
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