Abstract:
|
One of the main problems that arises when
performing short-circuit tests to large loops involving substation
connectors is the inductive component of the loop impedance.
Transformers used to perform short-circuit tests have a
secondary winding with very few turns, producing a very low
output voltage. The increase in the reactive component of the
impedance, which is related to loop size, limits the current output
capacity, because the reactive component tends to saturate the
output of the transformer and absorbs large amounts of reactive
power. This paper analyzes a simple method to minimize the
power requirements when conducting short-circuit tests, based
on the reduction of reactive power consumption during the test.
It is based on placing a wired conductor forming a closed inner
loop concentric with the testing loop. The decrease of reactive
power is related to the effect of the mutual inductance between
the inner and outer loops. Three-dimensional finite element
method (3D-FEM) simulations are used to optimize the problem,
allowing changing the geometric and material properties of the
inner loop. Experimental results validate the simulation method
applied in this work to optimize the short-circuit tests |