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Título:
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An on-line test strategy and analysis for a 1T1R crossbar memory
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Autor/a:
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Escudero, Manel; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio; Vourkas, Ioannis
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Otros autores:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
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Abstract:
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© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
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Abstract:
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Memristors are emerging devices known by their
nonvolability, compatibility with CMOS processes and high
density in circuits density in circuits mostly owing to the crossbar
nanoarchitecture. One of their most notable applications is in
the memory system field. Despite their promising characteristics
and the advancements in this emerging technology, variability
and reliability are still principal issues for memristors. For these
reasons, exploring techniques that check the integrity of circuits is
of primary importance. Therefore, this paper proposes a method
to perform an on-line test capable to detect a single failure inside
the memory crossbar array. |
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Abstract:
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Peer Reviewed |
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Materia(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats
-Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors::Arquitectures paral·leles
-Integrated circuits
-Computer architecture
-Memristors
-RRAM
-Test
-Circuits integrats
-Arquitectura d'ordinadors |
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Derechos:
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Tipo de documento:
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Artículo - Versión presentada
Objeto de conferencia |
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Editor:
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Institute of Electrical and Electronics Engineers (IEEE)
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Compartir:
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