Anatase is a pivotal material in devices for energy-harvesting applications and catalysis.

Methods for the accurate characterization of this reducible oxide at the atomic scale are

critical in the exploration of outstanding properties for technological developments. Here

we combine atomic force microscopy (AFM) and scanning tunnelling microscopy (STM),

supported by first-principles calculations, for the simultaneous imaging and unambiguous

identification of atomic species at the (101) anatase surface. We demonstrate that dynamic

AFM-STM operation allows atomic resolution imaging within the material’s band gap. Based

on key distinguishing features extracted from calculations and experiments, we identify

candidates for the most common surface defects. Our results pave the way for the understanding

of surface processes, like adsorption of metal dopants and photoactive molecules,

that are fundamental for the catalytic and photovoltaic applications of anatase, and

demonstrate the potential of dynamic AFM-STM for the characterization of wide band gap

materials.