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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | García Almudéver, Carmen |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2012 |
dc.identifier.citation | García, C.; Rubio, J.A. Variability and reliability analysis of CNFET in the presence of carbon nanotube density fluctuation. A: Mixed Design of Integrated Circuits and Systems. "Proceedings of the 19th International Conference". Warsaw: IEEE Press. Institute of Electrical and Electronics Engineers, 2012, p. 124-129. |
dc.identifier.citation | 9788362954438 |
dc.identifier.uri | http://hdl.handle.net/2117/16298 |
dc.language.iso | eng |
dc.publisher | IEEE Press. Institute of Electrical and Electronics Engineers |
dc.relation | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6226286 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Optoelectrònica |
dc.subject | Nanotubes |
dc.subject | Nanotubs |
dc.title | Variability and reliability analysis of CNFET in the presence of carbon nanotube density fluctuation |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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