To access the full text documents, please follow this link: http://hdl.handle.net/2117/17842
Title: |
Comparison of B-spline and Zernike fitting techniques in complex wavefront surfaces; Optical Measurement Systems for Industrial Inspection IV |
---|---|
Author: | Ares Rodríguez, Miguel; Royo Royo, Santiago; Caum Aregay, Jesús; Pizarro Bondia, Carlos |
Other authors: | Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.; Universitat Politècnica de Catalunya. Departament d'Òptica i Optometria; Universitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica |
Subject(s): | -Àrees temàtiques de la UPC::Enginyeria electrònica -Polynomials -Surface waves -Polinomis -Ones |
Rights: | Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
Document type: | Article - Published version Article |
Published by: | Proc.SPIE Press |
Share: |