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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Gómez, Didac |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Mateo Peña, Diego |
dc.date | 2012-10 |
dc.identifier.citation | Gómez, D.; Altet, J.; Mateo, D. On the use of static temperature measurements as process variation observable. "Journal of electronic testing. Theory and applications", Octubre 2012, vol. 28, núm. 5, p. 685-695. |
dc.identifier.citation | 0923-8174 |
dc.identifier.citation | 10.1007/s10836-012-5298-z |
dc.identifier.uri | http://hdl.handle.net/2117/19875 |
dc.language.iso | eng |
dc.relation | http://link.springer.com/article/10.1007%2Fs10836-012-5298-z |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria agroalimentària::Ciències de la terra i de la vida::Climatologia i meteorologia |
dc.subject | Temperature measurements |
dc.subject | CMOS process variation |
dc.subject | Design for manufacturability |
dc.subject | RF built-in test |
dc.subject | RF thermal testing |
dc.subject | Thermal monitoring |
dc.subject | Termometria |
dc.title | On the use of static temperature measurements as process variation observable |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
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