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Títol:	Infrared characterization of a-Si:H/a-Si1-xCx:H interfaces
Autor/a:	Bertomeu i Balagueró, Joan; Puigdollers i González, Joaquim; Asensi López, José Miguel; Andreu i Batallé, Jordi
Altres autors:	Universitat de Barcelona
Abstract:	Infrared spectroscopy was used to characterize three series of a-Si:H/a-Si1-xCx:H multilayers in which their geometrical parameters were varied. The infrared active vibrational groups in their spectra and the interference fringes in their absorption-free zone were studied to analyze the interfaces and the changes that are produced in very thin layers. Our results show that hydrogen is bonded to silicon only in monohydride groups. No additional hydrogen could be detected at these interfaces. The deposition of very thin a-Si1-xCx:H layers seems to affect their porous structure, making them denser.
Matèries:	-Espectroscòpia infraroja -Pel·lícules fines -Hidrogen -Semiconductors amorfs -Porositat -Infrared spectroscopy -Thin films -Hydrogen -Amorphous semiconductors -Porosity
Drets:	(c) Elsevier B.V., 1997
Tipus de document:	Article Article - Versió acceptada
Publicat per:	Elsevier B.V.
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