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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Gómez Salinas, Dídac |
dc.contributor.author | Aragonès Cervera, Xavier |
dc.date | 2013 |
dc.identifier.citation | Mateo, D. [et al.]. Temperature as observable magnitude in silicon integrated circuits to characterize high frequency analog circuits. A: International Conference on Materials Engineering for Resources. "ICMR 2013 AKITA: International Conference on Materials Engineering for Resources: November 20 Wed.-22 Fri., 2013: Akita View Hotel, Akita City, Japan". Akita City: 2013, p. 73-76. |
dc.identifier.uri | http://hdl.handle.net/2117/22055 |
dc.language.iso | eng |
dc.relation | http://smerj.ie.akita-u.ac.jp/icmr/icmr.htm |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Materials -- Congresses |
dc.subject | Integrated circuits |
dc.subject | Silicon temperature measurement |
dc.subject | CMOS millimeter wave integrated circuits |
dc.subject | Design for Testability |
dc.subject | Materials -- Congressos |
dc.subject | Circuits integrats |
dc.title | Temperature as observable magnitude in silicon integrated circuits to characterize high frequency analog circuits |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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