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dc.contributor | Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics |
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dc.contributor.author | Santos Hernández, Sergio |
dc.date | 2014-04-07 |
dc.identifier.citation | Santos, S. Phase contrast and operation regimes in multifrequency atomic force microscopy. "Applied physics letters", 07 Abril 2014, vol. 104, núm. 14. |
dc.identifier.citation | 0003-6951 |
dc.identifier.citation | 10.1063/1.4870998 |
dc.identifier.uri | http://hdl.handle.net/2117/23181 |
dc.language.iso | eng |
dc.relation | http://scitation.aip.org/content/aip/journal/apl/104/14/10.1063/1.4870998 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Atomic force microscopy |
dc.subject | Modulation (Electronics) |
dc.subject | Soft matter |
dc.subject | Mode |
dc.subject | Energy |
dc.subject | Liquid |
dc.subject | AFM |
dc.subject | Microscòpia de força atòmica |
dc.subject | Modulació (Electrònica) |
dc.title | Phase contrast and operation regimes in multifrequency atomic force microscopy |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
dc.description.abstract |