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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.contributor.author | Weiner, Michael |
dc.contributor.author | Manich Bou, Salvador |
dc.contributor.author | Sigl, Georg |
dc.date | 2014 |
dc.identifier.citation | Weiner, M.; Manich, S.; Sigl, G. A low area probing detector for security IC's. A: Workshop on Trustworthy Manufacturing and Utilization of Secure Devices. "Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, TRUDEVICE 2014". Paderborn: 2014, p. 1-6. |
dc.identifier.uri | http://hdl.handle.net/2117/24973 |
dc.language.iso | eng |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Informàtica::Seguretat informàtica |
dc.subject | Computer security |
dc.subject | hardware security countermeasures |
dc.subject | Digital Integrated Circuits |
dc.subject | Security |
dc.subject | Smart Cards |
dc.subject | Data Buses |
dc.subject | Microprobing |
dc.subject | Invasive Attacks |
dc.subject | Seguretat informàtica |
dc.title | A low area probing detector for security IC's |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |