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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Pouyan, Peyman |
dc.contributor.author | Amat, Esteve |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2015 |
dc.identifier.citation | Pouyan, P., Amat, E., Rubio, A. Statistical lifetime analysis of memristive crossbar matrix. A: International Conference on Design & Technology of Integrated Systems in Nanoscale Era. "2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2015): Napoli, Italy: 21–23 April 2015". Napoli: Institute of Electrical and Electronics Engineers (IEEE), 2015, p. 1-6. |
dc.identifier.citation | 9781479920006 |
dc.identifier.citation | 10.1109/DTIS.2015.7127378 |
dc.identifier.uri | http://hdl.handle.net/2117/86599 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7127378&tag=1 |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TEC2013-45638-C3-2-R |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Electric engineering |
dc.subject | Memristor |
dc.subject | Uncertainty |
dc.subject | Crossbar |
dc.subject | Endurance |
dc.subject | Process variability |
dc.subject | RRAM |
dc.subject | Emerging device |
dc.subject | Enginyeria elèctrica |
dc.subject | Electrònica -- Materials |
dc.subject | Circuits elèctrics |
dc.title | Statistical lifetime analysis of memristive crossbar matrix |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |