Title:
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Irreversible entropy model for damage diagnosis in resistors
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Author:
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Cuadras Tomàs, Àngel; Crisóstomo, Javier; Ovejas Benedicto, Victòria Júlia; Quílez Figuerola, Marcos
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies |
Abstract:
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We propose a method to characterize electrical resistor damage based on entropy measurements.
Irreversible entropy and the rate at which it is generated are more convenient parameters than
resistance for describing damage because they are essentially positive in virtue of the second law
of thermodynamics, whereas resistance may increase or decrease depending on the degradation
mechanism. Commercial resistors were tested in order to characterize the damage induced by
power surges. Resistors were biased with constant and pulsed voltage signals, leading to power
dissipation in the range of 4–8 W, which is well above the 0.25W nominal power to initiate failure.
Entropy was inferred from the added power and temperature evolution. A model is proposed to
understand the relationship among resistance, entropy, and damage. The power surge dissipates
into heat (Joule effect) and damages the resistor. The results show a correlation between entropy
generation rate and resistor failure. We conclude that damage can be conveniently assessed from
irreversible entropy generation. Our results for resistors can be easily extrapolated to other systems
or machines that can be modeled based on their resistance |
Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica -Electric resistors -entropy -damage -aging -degradation -resistor -Resistors |
Rights:
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http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
Document type:
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Article - Submitted version Article |
Published by:
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American Institute of Physics (AIP)
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