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dc.contributor | Barcelona Supercomputing Center |
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dc.contributor.author | Espinosa, Jaime |
dc.contributor.author | Hernandez, Carles |
dc.contributor.author | Abella, Jaume |
dc.contributor.author | de Andres, David |
dc.contributor.author | Ruiz, Juan C. |
dc.date | 2015 |
dc.identifier.citation | 0738-100X |
dc.identifier.citation | 10.1145/2744769.2744798 |
dc.identifier.uri | http://hdl.handle.net/2117/87263 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7167224&openedRefinements%3D*%26filter%3DAND%28NOT%284283010803%29%29%26pageNumber%3D8%26rowsPerPage%3D100%26queryText%3DDesign+Automation+Conference |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TIN2012-34557 |
dc.relation | info:eu-repo/grantAgreement/EC/FP7/287759/EU/High Performance and Embedded Architecture and Compilation/HIPEAC |
dc.relation | info:eu-repo/grantAgreement/ES/RYC-2013-14717 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Simulation and Modeling |
dc.subject | Automotive technology |
dc.subject | Automotive engineering |
dc.subject | Benchmark testing |
dc.subject | Robustness |
dc.subject | Electrònica--Automòbils |
dc.subject | Simulació, Mètodes de |
dc.title | Analysis and RTL correlation of instruction set simulators for automotive microcontroller robustness verification |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
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