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dc.contributor | Barcelona Supercomputing Center |
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dc.contributor.author | Riera, Marc |
dc.contributor.author | Canal, Ramon |
dc.contributor.author | Abella, Jaume |
dc.contributor.author | Gonzalez, Antonio |
dc.date | 2016-03 |
dc.identifier.citation | Riera, Marc [et al.]. A detailed methodology to compute Soft Error Rates in advanced technologies. A: Design, Automation & Test in Europe Conference & Exhibition (DATE), 14-18 March 2016, Dresden. "2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)". Institute of Electrical and Electronics Engineers (IEEE), 2016, p. 217-222. |
dc.identifier.uri | http://hdl.handle.net/2117/87283 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7459307 |
dc.relation | info:eu-repo/grantAgreement/MINECO/TIN2013-44375- R |
dc.relation | info:eu-repo/grantAgreement/EC/FP7/611404 |
dc.relation | info:eu-repo/grantAgreement/MINECO/RYC-2013-14717 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Soft errors (Computer science) |
dc.subject | Computer simulation |
dc.subject | Computational modeling |
dc.subject | Integrated circuit modeling |
dc.subject | Reliability |
dc.subject | Software fault tolerance |
dc.subject | Simulació per ordinador |
dc.title | A detailed methodology to compute Soft Error Rates in advanced technologies |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
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