Development of self-calibration techniques for on-wafer and fixtured measurements: a novel approach

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dc.contributor	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.contributor	Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.contributor.author	Pradell i Cara, Lluís
dc.contributor.author	Purroy Martín, Francesc
dc.contributor.author	Cáceres, M.
dc.date	1992
dc.identifier.citation	Pradell, L., Purroy, F., Cáceres, M. Development of self-calibration techniques for on-wafer and fixtured measurements: a novel approach. A: European Microwave Conference. "EuMC 1992: 22nd European Microwave Conference: September 5-9, 1992". Espoo: . MICROWAVE EXHIBITIONS AND PUBLISHERS, 1992, p. 919-924.
dc.identifier.citation	0946821771
dc.identifier.citation	10.1109/EUMA.1992.335822
dc.identifier.uri	http://hdl.handle.net/2117/100692
dc.language.iso	eng
dc.publisher	. MICROWAVE EXHIBITIONS AND PUBLISHERS
dc.relation	http://ieeexplore.ieee.org/document/4135567/
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subject	Àrees temàtiques de la UPC::Enginyeria de la telecomunicació
dc.subject	Telecommunication
dc.subject	Land mobile radio
dc.subject	Calibration
dc.subject	Microstrip
dc.subject	Transmission line measurements
dc.subject	Semiconductor device measurement
dc.subject	Equations
dc.subject	Transmission line matrix methods
dc.subject	Scattering parameters
dc.subject	Coaxial components
dc.subject	Transmission line theory
dc.subject	Telecomunicació
dc.title	Development of self-calibration techniques for on-wafer and fixtured measurements: a novel approach
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	info:eu-repo/semantics/conferenceObject
dc.description.abstract	Network Analyzer self-calibration techniques - TRL, LMR, TAR- are developed, implemented and compared in several transmission media. A novel LMR (Line-Match-Reflect) technique based on known LINE and REFLECT Standards, is proposed and compared to conventional LMR (based on known LINE and MATCH Standards) and other techniques (TRL, TAR). They are applied to on-wafer S-parameter measurement as well as to coaxial, waveguide and microstrip media. Experimental results up to 40 GHz are presented.
dc.description.abstract	Peer Reviewed

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