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dc.contributor | Universitat Politècnica de Catalunya. Institut de Ciències de l'Educació |
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dc.contributor.author | Vidas, Luciana |
dc.contributor.author | Günther, Christian M. |
dc.contributor.author | Miller, Timothy A. |
dc.contributor.author | Pfau, Bastian |
dc.contributor.author | Perez-Salinas, Daniel |
dc.contributor.author | Martínez, Elías |
dc.contributor.author | Schneider, Michael |
dc.contributor.author | Guehers, Erik |
dc.contributor.author | Gargiani, Pierluigi |
dc.contributor.author | Valvidares, Manuel |
dc.contributor.author | Marvel, Robert E. |
dc.contributor.author | Hallman, Kent A. |
dc.contributor.author | Haglund, Richard F. |
dc.contributor.author | Eisebitt, Stefan |
dc.contributor.author | Wall, Simon |
dc.date | 2018-05-16 |
dc.identifier.citation | Vidas, L. [et al.]. Imaging Nanometer Phase Coexistence at Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films by Resonant Soft X‑ray Holography. "Nano Letters", 16 Maig 2018. |
dc.identifier.citation | 10.1021/acs.nanolett.8b00458 |
dc.identifier.uri | http://hdl.handle.net/2117/117423 |
dc.language.iso | eng |
dc.publisher | ACS |
dc.relation | https://pubs.acs.org/doi/abs/10.1021/acs.nanolett.8b00458?journalCode=nalefd |
dc.relation | SEV-2015-0522 |
dc.relation | CIG12-GA-2013-618487 |
dc.relation | EECS-1509740 |
dc.relation | DMR-1207507 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Física |
dc.subject | Holography |
dc.subject | holography |
dc.subject | Holografia |
dc.title | Imaging Nanometer Phase Coexistence at Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films by Resonant Soft X‑ray Holography |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
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