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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Gómez Salinas, Didac |
dc.contributor.author | Dufis, Cédric Yvan |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.author | González Jiménez, José Luis |
dc.date | 2012-09 |
dc.identifier.citation | Gómez, D., Dufis, C., Altet, J., Mateo, D., Gonzalez, J. Electro-thermal coupling analysis methodology for RF circuits. "Microelectronics journal", Setembre 2012, vol. 43, núm. 9, p. 633-641. |
dc.identifier.citation | 0026-2692 |
dc.identifier.citation | 10.1016/j.mejo.2011.04.011 |
dc.identifier.uri | http://hdl.handle.net/2117/117438 |
dc.language.iso | eng |
dc.relation | https://www.sciencedirect.com/science/article/pii/S0026269211000917 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
dc.subject | Microelectronics |
dc.subject | CAD tools |
dc.subject | Electro-thermal co-simulation |
dc.subject | Thermal coupling simulation |
dc.subject | RFIC |
dc.subject | CMOS |
dc.subject | Microelectrònica |
dc.title | Electro-thermal coupling analysis methodology for RF circuits |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
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