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Título:	Optoelectronic properties of CuPc thin films deposited at different substrate temperatures
Autor/a:	Pirriera, Della M; Puigdollers i González, Joaquim; Voz Sánchez, Cristóbal; Stella, M; Bertomeu Balaguero, Joan; Alcubilla González, Ramón
Otros autores:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
Abstract:	Structural and optical characterization of copper phthalocyanine thin film thermally deposited at different substrate temperatures was the aim of this work. The morphology of the films shows strong dependence on temperature, as can be observed by atomic force microscopy and x-ray diffraction spectroscopy, specifically in the grain size and features of the grains. The increase in the crystal phase with substrate temperature is shown by x-ray diffractometry. Optical absorption coefficient measured by photothermal deflection spectroscopy and optical transmittance reveal a weak dependence on the substrate temperature. Besides, the electro-optical response measured by the external quantum efficiency of Schottky ITO/CuPc/Al diodes shows an optimized response for samples deposited at a substrate temperature of 60¿°C, in correspondence to the I–V diode characteristics.
Abstract:	Peer Reviewed
Materia(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica::Optoelectrònica -Optoelectronics -Optoelectrònica
Derechos:
Tipo de documento:	Artículo - Versión publicada Artículo
Editor:	Institute of Physics (IOP)
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