Title:
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Benefits of applying nodal sampling to SMOS data over semi-enclosed seas and strongly RFI-contaminated regions
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Author:
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González Gambau, Verónica; Olmedo, Estrella; Martinez, J.; Turiel, Antonio; Corbella Sanahuja, Ignasi; Oliva, Roger; Martín Neira, Manuel
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Other authors:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
Abstract:
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Radio Frequency Interferences (RFI) are still an important source of contamination in SMOS data. The application of nodal sampling (NS) to brightness temperature images helps to mitigate the degradation that RFIs produce in geophysical retrievals. Nodal sampling has been extensive and successfully tested over open ocean and in the proximity to coastal regions. In this work, we assess the performances of NS over strongly RFI-contaminated ocean regions, particularly over semi-enclosed seas. These regions are especially challenging because of the strong contamination caused by the nearby RFI sources over land and the residual land-sea contamination. |
Abstract:
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Peer Reviewed |
Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica -Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Teledetecció -Soil moisture -Remote sensing -Coastal areas -Image reconstruction -Interferometry -Nodal sampling -Radio frequency interferences -Semi-enclosed seas -Soil Moisture Ocean Salinity (SMOS) Coastal zones -Contamination -Geology -Image reconstruction -Interferometry -Partial discharges -Radio waves -Remote sensing -Soil moisture -Brightness temperature images -Coastal area -Coastal regions -Open ocean -Radio frequency interference -Semi-enclosed seas -Soil moisture ocean salinities -Radio interference -Sòls -- Humitat -Teledetecció |
Rights:
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Document type:
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Article - Published version Conference Object |
Published by:
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Institute of Electrical and Electronics Engineers (IEEE)
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