The environment of graphene probed by electrostatic force microscopy
Moser, Joel; Verdaguer Prats, Albert; Jiménez Jiménez, David; Barreiro Megino, Amelia; Bachtold, Adrian; American Physical Society
-Graphene
-Adhesion
-Electric fields
-Electrostatics
-Atomic force microscopy
-Contact potential
-Graphite
-Monolayers
-Carbon
-Topography
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https://ddd.uab.cat/record/116045

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