High frequency components of current fluctuations in semiconductor tunneling barriers
Oriols, Xavier; Suñé, Jordi,; Martín, Ferran,; American Physical Society
2021-09-09
-Semiconductors
-Tunneling
-Acoustic noise measurement
-Acoustic noise spectra
-Frequency measurement
-High frequency effects
-Noise propagation
-Spectrum analysis
open access
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https://ddd.uab.cat/record/116258

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