Title:
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SMOS calibration and instrument performance after one year in orbit
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Author:
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Oliva, Ramon; Martín Neira, Manuel; Corbella Sanahuja, Ignasi; Torres Torres, Francisco; Kainulainen, J.; Tenerelli, J.; Cabot, F.; Martín Porqueras, F.
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Other authors:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones; Universitat Politècnica de Catalunya. RSLAB - Grup de Recerca en Teledetecció |
Abstract:
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This paper summarizes the rationale for the European Space Agency's Soil Moisture and Ocean Salinity (SMOS) mission routine calibration plan, including the analysis of the calibration parameter annual variability, and the performances and stability of SMOS images after one year of data. SMOS spends 1.68% of the total observation time in calibration. The instrument performs well within expectations with regard to accuracy and radiometric sensitivity, although spatial ripples are present in SMOS images. Several mechanisms are currently used or under investigation to mitigate this problem. Also, a loss antenna model has recently been introduced to correct for physical temperature-induced effects. This antenna model successfully corrects observed orbital variations, but has difficulties in correcting brightness temperature long-term drifting, as assessed using relatively well-known targets other than the external calibration region-cold space. |
Abstract:
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Peer Reviewed |
Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Teledetecció -Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Antenes i agrupacions d'antenes -Remote sensing -Microwave antennas -Calibration -instrument performance -L-band radiometry -satellite remote sensing -Soil Moisture and Ocean Salinity (SMOS) mission -Teledetecció -Antenes de microones |
Rights:
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Document type:
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Article - Published version Article |
Published by:
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Institute of Electrical and Electronics Engineers (IEEE)
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