To access the full text documents, please follow this link: http://hdl.handle.net/2117/23207
Title: | Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers |
---|---|
Author: | Altet Sanahujes, Josep; González, José Luis; Gómez Salinas, Dídac; Perpiñà Gilabet, Xavier; Claeys, Wilfrid; Grauby, Stéphane; Dufis, Cédric Yvan; Vellvehi, Miquel; Mateo Peña, Diego; Reverter Cubarsí, Ferran; Dilhaire, Stefan; Jordà, Xavier |
Other authors: | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions; Universitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics |
Abstract: | |
Abstract: | |
Subject(s): | -Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats -Integrated circuits -CMOS differential temperature sensors -CMOS integrated circuits -Electro-thermal characterization -IR camera measurements -Laser interferometer measurements -Thermal coupling characterization -Circuits integrats |
Rights: | Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
Document type: | Article - Published version Article |
Share: |