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Title: | Imaging Nanometer Phase Coexistence at Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films by Resonant Soft X‑ray Holography |
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Author: | Vidas, Luciana; Günther, Christian M.; Miller, Timothy A.; Pfau, Bastian; Perez-Salinas, Daniel; Martínez, Elías; Schneider, Michael; Guehers, Erik; Gargiani, Pierluigi; Valvidares, Manuel; Marvel, Robert E.; Hallman, Kent A.; Haglund, Richard F.; Eisebitt, Stefan; Wall, Simon |
Other authors: | Universitat Politècnica de Catalunya. Institut de Ciències de l'Educació |
Abstract: | |
Abstract: | |
Subject(s): | -Àrees temàtiques de la UPC::Física -Holography -holography -Holografia |
Rights: | Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
Document type: | Article - Submitted version Article |
Published by: | ACS |
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