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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Serre, Christophe |
dc.contributor.author | Pérez Rodríguez, Alejandro |
dc.contributor.author | Romano Rodríguez, Alberto |
dc.contributor.author | Morante i Lleonart, Joan Ramon |
dc.contributor.author | Kögler, Reinhard |
dc.contributor.author | Skorupa, Wolfgang |
dc.date | 2012-05-02T07:20:34Z |
dc.date | 2012-05-02T07:20:34Z |
dc.date | 1995-04-01 |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 93577 |
dc.identifier.uri | http://hdl.handle.net/2445/24726 |
dc.format | 7 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.358714 |
dc.relation | Journal of Applied Physics, 1995, vol. 77, núm. 7, p. 2978-2984 |
dc.relation | http://dx.doi.org/10.1063/1.358714 |
dc.rights | (c) American Institute of Physics, 1995 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Cristal·lografia |
dc.subject | Espectroscòpia |
dc.subject | Crystallography |
dc.subject | Spectrum analysis |
dc.title | Spectroscopic characterization of phases formed by high-dose carbon ion implantation in silicon |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |