Charge induced by ionizing radiation understood as a disturbance in a sliding mode control of dielectric charge

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To access the full text documents, please follow this link: http://hdl.handle.net/2117/83849

dc.contributor	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor	Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
dc.contributor.author	Domínguez Pumar, Manuel
dc.contributor.author	Gorreta Mariné, Sergio
dc.contributor.author	Pons Nin, Joan
dc.contributor.author	Gomez Rodriguez, Faustino
dc.contributor.author	Gonzalez Castaño, Diego
dc.date	2015-07-03
dc.identifier.citation	Dominguez, M., Gorreta, S., Pons, J., Gomez, F., Gonzalez, D. Charge induced by ionizing radiation understood as a disturbance in a sliding mode control of dielectric charge. "Microelectronics reliability", 03 Juliol 2015, vol. 55, núm. 9-10, p. 1926-1931.
dc.identifier.citation	0026-2714
dc.identifier.citation	10.1016/j.microrel.2015.06.084
dc.identifier.uri	http://hdl.handle.net/2117/83849
dc.language.iso	eng
dc.relation	http://www.sciencedirect.com/science/article/pii/S0026271415001766
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subject	Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
dc.subject	Microelectronics
dc.subject	Dielectrics
dc.subject	Dielectric charge control
dc.subject	Sliding mode control
dc.subject	Charge trapping
dc.subject	Ionizing radiation
dc.subject	Microelectrònica
dc.subject	Dielèctrics
dc.title	Charge induced by ionizing radiation understood as a disturbance in a sliding mode control of dielectric charge
dc.type	info:eu-repo/semantics/submittedVersion
dc.type	info:eu-repo/semantics/article
dc.description.abstract	The purpose of this paper is to show that the charge induced by radiation in a dielectric on which a sigma–delta control of dielectric charge is implemented, can be seen as a disturbance in a sliding mode controller. Preliminary experimental results are presented in which a MEMS device is irradiated with X-rays, while the dielectric charge control is continuously being monitored. The charge induced by radiation generates a change in the control bitstream, which is associated with the presence of an external disturbance on the governing control equations.
dc.description.abstract	Peer Reviewed

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