Título:
|
Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect
|
Autor/a:
|
Perpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel; Mestres, Narcís
|
Otros autores:
|
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
Abstract:
|
This Letter presents a solution for locating hot spots in active integrated circuits (IC) and devices. This method is
based on sensing the phase lag between the power periodically dissipated by a device integrated in an IC (hot spot)
and its corresponding thermal gradient into the chip substrate by monitoring the heat-induced refractive index
gradient with a laser beam. The experimental results show a high accuracy and prove the suitability of this
technique to locate and characterize devices behaving as hot spots in current IC technologies. |
Materia(s):
|
-Àrees temàtiques de la UPC::Enginyeria electrònica -System-on-chip design and technologies -Electronic engineering -Integrated circuits -Metal oxide semiconductor field-effect transistors -Transistors -Electrònica |
Derechos:
|
|
Tipo de documento:
|
Artículo - Versión publicada Artículo |
Compartir:
|
|