Title:
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Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits
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Author:
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Boyer, Alexandre; Dhia, Sonia Ben; Fernández García, Raúl; Berbel Artal, Néstor
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group |
Abstract:
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Recent studies have shown that the aging of integrated
circuits may modify electromagnetic emission significantly. This
paper reports on an experiment to elucidate the origins of emis-
sion level changes in a test chip using 90-nm CMOS technology.
Circuit analysis, combined with electromagnetic emission and on-
chip power supply voltage bounce measurements made during the
application of electric stress, have identified the role of intrinsic
wear-out mechanisms, which contribute to a progressive change in
the transient current produced by the circuit. |
Abstract:
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Peer Reviewed |
Subject(s):
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-Semiconductors -Electronic circuits -Aging effects -electromagnetic emission -integrated circuits -semiconductor device reliability -Semiconductors -Electromagnetisme -Circuits integrats -Electromagnetism |
Rights:
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Document type:
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Article - Published version Article |
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