Título:
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S-parameter measurement of chip Ga As FETs up to 22 GHz using the TRL calibration technique
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Autor/a:
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Pradell i Cara, Lluís; Artal, E; Sabater, C
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Otros autores:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
Abstract:
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In this paper, the design of a Microstrip Test Fixture for TRL calibration is described. Experimental results for S-parameters measurement of a GaAs FET chip in the 3-22 GHz frequency range are presented. Repeatability of connections and measurements is discussed and experimental results are also presented. |
Abstract:
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Peer Reviewed |
Materia(s):
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació -Radio frequency -Calibration -Connectors -Radiofreqüència |
Derechos:
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Tipo de documento:
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Artículo - Versión publicada Objeto de conferencia |
Editor:
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Institute of Electrical and Electronics Engineers (IEEE)
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