On the classification of self-triggered versus other-triggered lightning flashes

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To access the full text documents, please follow this link: http://hdl.handle.net/2117/126589

Title:	On the classification of self-triggered versus other-triggered lightning flashes
Author:	Sunjerga, A.; Mostajabi, A.; Pineda Rüegg, Nicolau; Romero Durán, David; Van der Velde, Oscar Arnoud; Montanya, Joan; Azadifar, M.; Rubinstein, M.; Diendorfer, Gergard
Other authors:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Elèctrica; Universitat Politècnica de Catalunya. LRG - Lightning Research Group
Abstract:	We present in this paper lightning current measurements and LMA (Lightning Mapping Array) data associated with upward flashes observed at the Sàntis Tower during Summer 2017. The LMA network consists of six stations located in the vicinity of the tower at distances ranging from 100 m to 11 km from it. 20 flashes simultaneously recorded by the current measurement system and the LMA are analyzed. Based on the lightning activity derived from the European Lightning Detection Network (EUCLID) in an area within 30 km from the tower and in a 5-second time window before the start of the flash, all the 20 flashes were classified as 'self-triggered' (ST). However, the investigations based on the LMA data reveal that 3 of the flashes were preceded by nearby activity and should be therefore classified as 'other-triggered' (OT) flashes. The results suggest that the number of OT flashes inferred from LLS data can be underestimated. © 2018 IEEE.
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Energies::Energia elèctrica::Electricitat -Lightning -Array processors -lightning -lightning location systems -lightning mapping array -other-triggered -self-triggered -upward lightning electric current measurement -lightning protection -mapping -lightning location systems -lightning mapping array -other-triggered -self-triggered -upward lightning -lightning -Llamps -Processadors de matrius (arrays)
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Document type:	Article - Published version Conference Object
Published by:	Institute of Electrical and Electronics Engineers (IEEE)
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