Measuring the electrical surface resistance of 2D materials without contact can provide a method for obtaining their intrinsic characterisation. The aim of this paper is to show that a rutile dielectric resonator (RDR) can be used to measure the electrical surface resistance of conducting coatings deposited on substrates, at the resonance frequency. Moreover, it is known that the substrate exerts a strong influence capable of intrinsically modify the properties of the 2D materials, as found in graphene. The RDR method is used for different samples of metals (Cu, Mo, Ti, brass), carbon nanotubes (bucky paper), a film of compacted graphene flakes, a film of compacted graphene oxide flakes and graphene obtained by CVD on different substrates (SiO2/Si, quartz and PET). The results show that reasonable values can be obtained for thin conducting materials with a thickness of not less than a few micrometers. In the case of graphene grown on a substrate, the presence of graphene is clearly detected but the resistivity value cannot be extracted.

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