dc.contributor.author
Palacín Roca, Jordi
dc.contributor.author
Salleras, Marc
dc.contributor.author
Samitier, Josep
dc.contributor.author
Marco, Santiago
dc.date.accessioned
2024-12-05T22:25:24Z
dc.date.available
2024-12-05T22:25:24Z
dc.date.issued
2016-07-13T12:14:24Z
dc.date.issued
2025-01-01
dc.identifier
https://doi.org/10.1109/TADVP.2005.850507
dc.identifier
http://hdl.handle.net/10459.1/57618
dc.identifier.uri
http://hdl.handle.net/10459.1/57618
dc.description.abstract
Whereas numerical modeling using finite-element
methods (FEM) can provide transient temperature distribution in
the component with enough accuracy, it is of the most importance
the development of compact dynamic thermal models that can
be used for electrothermal simulation. While in most cases single
power sources are considered, here we focus on the simultaneous
presence of multiple sources. The thermal model will be in the
form of a thermal impedance matrix containing the thermal
impedance transfer functions between two arbitrary ports. Each
individual transfer function element ( ) is obtained from the
analysis of the thermal temperature transient at node “ ” after
a power step at node “ .” Different options for multiexponential
transient analysis are detailed and compared. Among the options
explored, small thermal models can be obtained by constrained
nonlinear least squares (NLSQ) methods if the order is selected
properly using validation signals. The methods are applied to the
extraction of dynamic compact thermal models for a new ultrathin
chip stack technology (UTCS).
dc.publisher
Institute of Electrical and Electronics Engineers
dc.relation
Reproducció del document publicat a https://doi.org/10.1109/TADVP.2005.850507
dc.relation
IEEE Transaction on Advanced Packaging, 2005, vol. 28, p. 694-703
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.subject
Dynamic compact thermal models
dc.subject
Thin electronics
dc.title
Dynamic Compact Thermal Models With Multiple Power Sources: Application to an Ultrathin Chip Stacking Technology