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| dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
|---|---|
| dc.contributor | Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics |
| dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
| dc.contributor.author | Rodríguez Montañés, Rosa |
| dc.contributor.author | Arumi Delgado, Daniel |
| dc.contributor.author | Manich Bou, Salvador |
| dc.contributor.author | Figueras Pàmies, Joan |
| dc.contributor.author | Di Carlo, Stefano |
| dc.contributor.author | Prinetto, Paolo |
| dc.contributor.author | Scionti, Alberto |
| dc.date | 2010 |
| dc.identifier.citation | Rodríguez, R. [et al.]. Defective Behaviour of an 8T SRAM Cell with Open Defects. A: International Conference on Advances in System Testing and Validation Lifecycle. "Second International Conference on Advances in System Testing and Validation Lifecycle". Niça: 2010, p. 81-86. |
| dc.identifier.citation | 978-1-4244-7784-5 |
| dc.identifier.citation | 10.1109/VALID.2010.19 |
| dc.identifier.uri | http://hdl.handle.net/2117/11989 |
| dc.language.iso | eng |
| dc.relation | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5617198 |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
| dc.rights | info:eu-repo/semantics/openAccess |
| dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
| dc.subject | Electronic engineering |
| dc.subject | Nanotecnologia |
| dc.subject | Enginyeria electrònica -- Congressos |
| dc.title | Defective Behaviour of an 8T SRAM Cell with Open Defects |
| dc.type | info:eu-repo/semantics/publishedVersion |
| dc.type | info:eu-repo/semantics/conferenceObject |
| dc.description.abstract |
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