Para acceder a los documentos con el texto completo, por favor, siga el siguiente enlace: http://hdl.handle.net/2117/78676

Título:	Analog circuits testing using digitally coded indirect measurements
Autor/a:	Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
Otros autores:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
Abstract:	Testing mixed-signal circuits is a challenging task requiring high amounts of human and technical resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform specification based tests using easy to measure CUT information. In this work, the acceptance/rejection regions are encoded using octrees with arbitrary precision regardless of the complexity of the boundary separating these regions. The strategy relies on two phases: (1) A statistical training phase generates the circuit samples to encode the acceptance/rejection regions using octrees. (2) The testing phase corresponds to the actual production testing of the fabricated ICs. The first phase is performed only once and requires sufficient samples of each pass/fail region to generate the octree under realistic CUT variations. The second phase is fast and only requires to evaluate the octree using the measures of the tested IC. In order to illustrate the proposal, the method has been applied to test a band-pass Biquad filter. Successful simulation results are reported showing considerable advantages in terms of test application time.
Materia(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica -Mixed signal circuits -- Testing -Coding theory -Electric filters, Digital -2n-Trees -Alternate Test -Analog Signature -Analog Testing -Band-Pass Filter -Biquad Filter -Classifiers -Indirect Measurements -Mixed-Signal Testing -Octrees -Quadtrees -Signature Compaction -Specification Based Test -Codificació, Teoria de la -Filtres digitals -Circuits de senyal mixta -- Proves
Derechos:	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
Tipo de documento:	Artículo - Versión publicada Objeto de conferencia
Editor:	Institute of Electrical and Electronics Engineers (IEEE)
Compartir:

Mostrar el registro completo del ítem